LISTECH releases image Xtract module

By on 8 December, 2015

xtract neo

The latest release of LISTECH Neo has a number of NEW modules, features and significant enhancements, including Neo Image Xtract, which enables object creation and measurement functionality directly from Images created by Imaging Total Stations.

With Image Xtract, you can now make productive use of Total Station Images by creating Points, Lines and Polygons, allowing you to extract measurements simply and intuitively. Images taken in the field are then no longer just images, but versatile survey measurement tools.

This provides many benefits, such as potentially avoiding field revisits, using Images for façade surveys, asset inspections and surveys with time or safety constraints.

xtract neo

Listed below are some of the unique features:

  • Automatic Image Selection: Select one image and Neo will automatically display other images that have an overlap and can be used for object computations.
  • Epipolar Line: Makes for easy digitising. Simply select a location on an image and an epipolar line is displayed on the paired image. This provides a quick guide for the selection of the corresponding object in the overlapped image.
  • Residual Values Displayed: Indicating the computed accuracy of the object to be created based on the geometry of the selected image pixels.
  • Calculated Best Fit: Provides the best fit position of a point based on the selected pixel locations.

For further information or to try a free 14 day evaluation visit the LISTECH web site or contact LISTECH at support@listech.com.

 

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